“A 2-DIMENSIONAL SEMICONDUCTOR CONTROLLING METHOD,” Korea, Registration; # 10-2878099 (2025). 

“ULTRA-PRECISION ELECTRON DENSITY CONTROLLER,” USA, Pending; # 19/290,631 (2025). 

“A compact single-source emitter module system based on a scanning electron microscope and its method,” Korea, Pending; # 10-2025-0172286 (2025). 

“Nano-Optical Spectroscopy System with Low Thermal Drift at Room Temperature,” Korea, Pending; # 10-2025-0148988 (2025). 

“LIGHT-EMITTING DEVICE AND METHOD AND APPARATUS FOR CONTROLLING THE INTENSITY OF A LIGHT SIGNAL,” Korea, Pending; # 10-2025-0168479 (2025). 

“METHOD AND APPARATUS FOR CONTROLLING EXCITON,” Korea, Pending; # 10-2025-0168512 (2025). 

“METHOD AND APPARATUS FOR RECORDING AND READING DATA,” Korea, Pending; # 10-2025-0168583 (2025). 

“ULTRA-PRECISION ELECTRON DENSITY CONTROL DEVICE,” Korea, Pending; # 10-2024-0143388 (2024). 

“ULTRA-FAST CONDUCTIVE OPTICAL RESONATOR,” Korea, Pending; # 10-2024-0143391 (2024). 

“Metal-semiconductor hybrid resonance illuminant system and Display device and quantum light source device using the resonance illuminant system,” Korea, Pending; # 10-2024-0086956 (2024). 

“AN ANALYSIS METHOD OF TIP-ENHANCED SPECTROSCOPY, AND A TIP-ENHANCED SPECTROSCOPY,” Korea, Registration; # 10-2619577 (2023). 

“AN OPTICAL SIGNAL RECORDING PROCESS AND MEDIUM,” Korea, Registration; # 10-2589324 (2023). 

“SYSTEM FOR EXCITON-TRION CONVERSION AND LIGHT EMISSION,” Korea, Pending; # 10-2023-0179365 (2023). 

“ENHANCED RAMAN SPECTROSCOPY APPARATUS AND METHOD USING NANOGAP,” Korea, Pending; # 10-2023-0116462 (2023). 

“A TIP-ENHANCED SPECTROSCOPY,” Korea, Pending; # 10-2023-0003096 (2023).

“A TIP-ENHANCED SPECTROSCOPY,” US, Pending; # 18/522,026 (2023).

“A TIP-ENHANCED SPECTROSCOPY,” EP, Pending; # 23211540.2 (2023). 

“A 2-DIMENSIONAL SEMICONDUCTOR CONTROLLING METHOD,” Korea, Pending; # 10-2023-0003097 (2023). 

“AN ANALYSIS METHOD OF TIP-ENHANCED SPECTROSCOPY, AND A TIP-ENHANCED SPECTROSCOPY,” Korea, Pending; # 10-2022-0182046 (2022). 

“DIGITALLY OPERATING SHEAR-FORCE ATOMIC FORCE MICROSCOPY AND OPERATION METHOD,” Korea, Pending; # 10-2021-0124827 (2021).

“METHOD FOR CONTROL AND ANALYSIS OF NANO-WRINKLE EMITTERS,” Korea, Pending; # 10-2021-0024218 (2021).

“ADAPTIVE TIP-ENHANCED NANO-SPECTROSCOPY,” PCT, Pending; # PCT/KR2020/018020 (2020). 

“ADAPTIVE TIP-ENHANCED NANO-SPECTROSCOPY,” Korea, Pending; # 10-2020-0115838 (2020). 

“BAND GAP ENGINEERING DEVICE OF SINGLE QUANTUM DOTS AND THE METHOD THEREOF,” PCT, Pending; # PCT/KR2020/018973 (2020). 

“BAND GAP ENGINEERING DEVICE OF SINGLE QUANTUM DOTS AND THE METHOD THEREOF,” Korea, Pending; # 10-2020-0106941 (2020). 

“SINGLE QUANTUM EMISSION GENERATOR AND THE METHOD THEREOF,” Korea, Pending; # 10-2020-0106940 (2020). 

“NEAR-FIELD SCANNING OPTICAL MICROSCOPE SYSTEM AND PROBE METHODS USING THE SAME,” Korea, Registration; # 10-1507108-00-00 (2015).

[Technology transfer to Park Systems] 

“AN OPTOELECTRONIC DEVICE AND THE MANUFACTURING METHOD THEREOF,” Korea, Registration; # 10-2012011-96-96 (2014).

“OPTICS MECHANISM AND METHOD OPERATING THE SAME,” Korea, Registration; # 10-1352800-00-00 (2014).

“OPTICAL COUPLING SYSTEM AND METHOD PERFORMING THE SAME,” Korea, Registration; # 10-1352801-00-00 (2014). 

“3-DIMENSIONAL CONFOCAL ELECTROLUMINESCENCE SPECTRAL-MICROSCOPE APPARATUS,” Korea, Registration; # 10-1302162-00-00 (2013).

“SCANNING ABSORPTION NANOSCOPY SYSTEM WITH SUPERCONTINUUM LIGHT SOURCES AND SPECTROSCOPING METHOD THEREOF,” Korea, Registration; # 10-127403-00-00 (2013).

“TIME-RESOLVED ULTRAVIOLET RAYS NEAR-FIELD SCANNING OPTICAL MICROSCOPE AND METHOD OF MEASURING USING THEREOF,” Korea, Registration; # 10-1213703-00-00 (2012).

“AUTOMATIC LASER-TO-OPTICAL-FIBER COUPLING SYSTEM,” Korea, Pending; App. # 10-2012-0083977 (2012).

“LASER MANUFACTURING METHOD OF NANOPARTICLE PROBES,” Korea, Pending; App. # 10-2012-0026891 (2012).

“SCANNING PROBE MICROSCOPY,” Korea, Registration; # 10-1211013-00-00 (2012).

“SCANNING PROBE MICROSCOPY,” USA, Pending; App. # 2011-279763 (2011).

“MECHANICALLY-COUPLED TUNING FORK-SCANNING PROBE VIBRATING SYSTEM,” China, Registration; # 200910172188.7 (2012).

“MECHANICALLY-COUPLED TUNING FORK-SCANNING PROBE VIBRATING SYSTEM,” Korea, Registration; # 10-1065981-00-00 (2011).

“MECHANICALLY-COUPLED TUNING FORK-SCANNING PROBE VIBRATING SYSTEM,” USA, Registration; # 8087093 (2011).

“MECHANICALLY-COUPLED TUNING FORK-SCANNING PROBE VIBRATING SYSTEM,” Japan, Registration; # 4884506 (2011).