- Quantum materials and condensed-matter nano-physics
- Nano-optics and light–matter interactions
- Semiconductor metrology, inspection, and process diagnostics
- Quantum information science, nanoscale quantum sensing & metrology
- Super-resolution (non)linear optical imaging & ultrafast spectroscopy
- Tip-enhanced optical spectroscopy & imaging: TEPL, TERS, and s-SNOM
- Quantum sensing for single-photon emitters and spin qubits
- Hyperspectral imaging and semiconductor metrology & inspection
- Data-driven inspection and AI-based virtual metrology
- Advanced nano-optical and scanning-probe based instrumentation
- Low-dimensional and emerging quantum materials
- Single quantum emitters, atomic-scale defects, molecules, and atoms
- Semiconductor thin films, nanostructures, devices, and advanced packaging
- Nanoscale interfaces, process variations, and structural or chemical defects
- Excitons, phonons, plasmons, polaritons, and hybrid quasiparticles
and many more ...
- Discover emerging quantum and photoinduced phenomena at the nanoscale
- Visualize and control quantum states and light–matter interactions
- Develop ultrahigh-sensitivity quantum sensing technologies
- Advance semiconductor metrology and inspection beyond conventional limits
- Transform nanoscale physical information into actionable process knowledge
- Bridge fundamental physics, quantum science, and semiconductor engineering
and many more ...